Talos F200E TEM
Talos F200E TEM
Thermo Scientific™

Talos F200E TEM

The Thermo Scientific Talos F200E (Scanning) Transmission Electron Microscope provides high-resolution STEM and TEM imaging with minimal distortion, combined with high-throughput energy-dispersive X-ray spectroscopy (EDS) functionality, tailored for a wide range of semiconductor defect analysis and research applications.
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Catalog number TALOS-F200E-TEM
Price (CNY)/ Each
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The Thermo Scientific Talos F200E (Scanning) Transmission Electron Microscope provides high-resolution STEM and TEM imaging with minimal distortion, combined with high-throughput energy-dispersive X-ray spectroscopy (EDS) functionality, tailored for a wide range of semiconductor defect analysis and research applications.
  • High-throughput, multi-purpose TEM with low-distortion imaging for a wide range of applications
  • 200 kV TEM and STEM for repeatable, high-volume analysis of a broad range of semiconductor and microelectronic devices.
Specifications
Description200 kV TEM and STEM microscope
TypeSTEM Microscope
Resolution≤0.16 nm
Unit SizeEach