Talos™ F200X G2 TEM

The Thermo Scientific™ Talos™ F200X is a scanning transmission electron microscope (S)TEM that combines outstanding high-resolution (S)TEM and TEM imaging with energy dispersive X-ray spectroscopy (EDS) signal detection. 2D/3D chemical characterization with compositional mapping is performed by 4 in-column SDD Super-X detectors with unique cleanliness. The Talos F200X (S)TEM allows for fast and precise EDS analysis in all dimensions, along with fast navigation for dynamic microscopy and reduced environmental sensitivity.

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The Talos F200X (S)TEM delivers fast, precise, quantitative characterization of nanomaterials in multiple dimensions. With innovative features designed to increase throughput, precision, and ease of use, the Talos F200X (S)TEM is ideal for advanced research and analysis in academic, government, semiconductor, and industrial environments.

The need for large area correlative imaging at high resolution has recently increased as it allows researchers to preserve the context of their observations while also providing statistically robust data. Thermo Scientific™ Maps Software (enabled by Thermo Scientific™ Velox Software) automatically acquires an array of images across a sample and stitches them together to create one large final image. Image acquisition can even be performed unattended. The APW (Automated Particle Workflow) pack has all the benefits described in this section and adds unique processing on a dedicated processing PC with Thermo Scientific™ Avizo2D Software. You can get nanoparticle parameters like size, area, perimeter, shape, factor, contacts, etc., in an automated way. The fully automated and unattended software pack enables you to use the Talos F200X (S)TEM 24/7, get much better statistics and significantly improve the repeatability because operator bias is not present.

Align Genie Automation Software eases the learning curve for novice operators, reduces tensions in a multi-user environment, and improves time-to-data for the experienced operator.

Talos F200X G2 Transmission Electron Microscope features:

• Available with a wide range of high-resolution field emissions guns (FEG)
  • Gun brightness at 200 kV: 1.8×109 A /cm2 srad (X-FEG); 2.4×109 A /cm2 srad (X-CFEG)
• Intuitive software
• Faster time to chemical composition
• Better image data
• Space for more
• High-quality (S)TEM images and accurate EDS
  • Super-X EDS system: 4 SDD symmetric design, windowless, shutter-protected
• Highly repeatable data collection