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Elemental analysis
Elemental analysis is the fundamental application of energy dispersive X-ray spectroscopy (EDS, EDX, or XEDS). EDS is used to add vital compositional information to electron microscopy images, providing a combined morphological and chemical overview of your sample. Modern X-ray analysis on the S/TEM employs EDS to reliably characterize a sample’s energy spectrum.
What is energy dispersive X-ray spectroscopy?
Energy dispersive X-ray spectroscopy (EDS) is a versatile analytical technique for characterizing chemical composition at the macro-, micro-, and nanoscales. EDS extracts compositional data by detecting X-rays emitted during electron beam scanning, and each element is identified by its distinct X-ray line profile. EDS can analyze a broad spectrum of elements from the periodic table, offering insights into element distribution. This technique plays a crucial role in extensive material characterization across diverse industrial and academic domains, including applications like process/quality control, failure analysis, and fundamental research.
ChemiPhase image of a refractory material (brown fused alumina) employed in steel production. The phase analysis shows the location of the alumina (light blue) but also the presence of unexpected materials that act as contamination, such as titanium oxide (displayed in pink) and fragments of silica (displayed in yellow)
Techniques utilizing energy dispersive X-ray spectroscopy
Explore techniques used in elemental analysis.
Energy dispersive X-ray spectroscopy applications
Discover how our technologies support applications from research and development to the materials industry.
For Research Use Only. Not for use in diagnostic procedures.