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Thermo Scientific Nexsa G2 X 射线光电子能谱仪(XPS)系统可进行全自动、高通量的表面分析,提供用于推进研发或解决生产问题的数据。 集成 XPS 与离子散射谱(ISS)、紫外光电子能谱 (UPS)、反射电子能量损失谱(REELS)和拉曼光谱,让您进行真正的联用分析。该系统现包含样品加热和样品加偏压功能选项,拓宽可进行的实验范围。Nexsa G2 表面分析系统发掘了材料科学、微电子、纳米技术开发和许多其他应用领域的潜力。
全新的低功率 X 射线单色器,允许以 5µm为间隔、选择10µm 到 400µm 之间的分析面积,确保从感兴趣的特征区域收集数据,同时使信号最大化。
高效的电子透镜、半球形分析器和检测器使其具有超强的检测能力和快速的数据采集能力。
使用Nexsa XPS 专利的光学观察系统和 SnapMap 功能聚焦样品特征区域,有助于快速定位感兴趣的区域。
专利的双束中和源:既能出射低能离子,又能出射低能电子(小于1 eV)。在测试中能够对样品,特别是绝缘样品,进行很好的中和,令数据分析简单而可靠。
利用标准离子源或 MAGCIS(可选的双模式单原子和气体团簇离子源)获取表面之下的信息;离子源的自动校准和气体团簇的处理确保了卓越的性能和实验的可重复性。
提供可选的各种特殊样品台,用于变角 XPS、样品加偏压测试或从手套箱惰性转移样品。
仪器控制、数据处理和报告均由基于 Windows 的 Avantage 数据系统控制。
全软件控制的样品加热功能选项,支持温度相关研究。
Animation: Thermo Scientific Nexsa surface analysis system
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X 射线源类型 |
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X 射线光斑尺寸 |
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深度剖析 |
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样品最大面积 |
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样品最大厚度 |
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真空系统 |
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Thermo Scientific Avantage Data System for XPS 的一个关键特色是一个庞大的知识库,其中包含有关 XPS分析及其表征的元素的信息。
High sensitivity for large areas, small X-ray spots for features and integrated surface analysis techniques, the Nexsa system has it all!
The Nexsa System is a high-performance X-ray Photoelectron Spectrometer, designed to integrate other analytical techniques while maintaining a high-throughput workflow.
Understanding Surface Chemistry with Avantage Software
By watching the webinar, you will learn how to: Use the right tools to understand multi-level data sets, such as depth profiles and images. Apply multi-variate techniques (such as PCA) to understand XPS images. Peak fit depth profile data sets to
This webinar will introduce these additional techniques and show how they can be used with XPS to build comprehensive understanding of the surfaces of materials.
The speakers Roland Barbosa (Covalent Metrology), Paul Mack and Herman Lemmens (Thermo Fisher Scientific) give presentations on multi-technique and complementary analysis.
High sensitivity for large areas, small X-ray spots for features and integrated surface analysis techniques, the Nexsa system has it all!
The Nexsa System is a high-performance X-ray Photoelectron Spectrometer, designed to integrate other analytical techniques while maintaining a high-throughput workflow.
Understanding Surface Chemistry with Avantage Software
By watching the webinar, you will learn how to: Use the right tools to understand multi-level data sets, such as depth profiles and images. Apply multi-variate techniques (such as PCA) to understand XPS images. Peak fit depth profile data sets to
This webinar will introduce these additional techniques and show how they can be used with XPS to build comprehensive understanding of the surfaces of materials.
The speakers Roland Barbosa (Covalent Metrology), Paul Mack and Herman Lemmens (Thermo Fisher Scientific) give presentations on multi-technique and complementary analysis.
为满足对表面进行广泛表征的需求,我们建立了基于使用Thermo Scientific ESCALAB CXi XPS微探针或Thermo Scientific Nexsa表面分析系统的多技术工作流程。这些仪器被设计成了多技术工作站,能够及时、高效地提供全面的分析。