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随着对高性能材料的需求日益增长，表面工艺的重要性也随之增加。材料表面是外部环境和材料发生相互作用的位置，将会对多方面产生影响，如腐蚀率、催化活性、粘性、润湿性、接触电位和失效机制等。
可通过表面改性来改变或改善这些特性；可通过表面分析来了解表面化学信息、研究表面工艺的效果。从不粘炊具涂层到薄膜电子和生物活性表面，X 射线光电子能谱是进行表面表征的标准工具之一。
X 射线光电子能谱 (XPS) 也称为用于化学分析的电子能谱 (ESCA)，是一种用于分析材料表面化学的技术。XPS 可以测试得到材料表面元素组成及化学态信息。
通过使用一束 X 射线照射固体表面并测量从材料表面 1-10 nm 发射的电子的动能来获得 XPS 谱图。通过对一定动能范围中出射的电子进行计数，记录光电子谱图。通过光电子峰的能量和强度实现对样品表面所有元素（氢除外）鉴定和相对定量。
表面表征
表面表示一种相与另一种相之间的不连续性；因此表面的物理和化学性质与材料体相不同。由于表面原子并不能在所有方向上被原子围绕，这些差异在很大程度上影响材料的最表面原子层。表面原子比体相原子更活泼，有可能成键。
表面层定义为大约 3 个原子层厚度（~1 nm），根据不同材料，表面层厚度不同。厚度不超过约 10 nm 的表面层为超薄层薄膜，不超过约 1 μm 的为薄膜。其余被称为材料体相。但是，这一术语并非明确定义，且各种层类型之间的差异取决于材料及其应用。
一台仪器，XPS多技术联用
当您查看样品时，您想知道哪项分析技术能为您提供所需的所有相关信息吗？您得到的答案是否通常为，没有一种技术能为您提供所需的所有相关信息？为了全面了解材料，您需要使用多种技术对其进行分析。当您使用一台仪器，多技术联用时，您可以结合 XPS、ISS、REELS、UPS 和拉曼等多种技术来更好地研究样品特性。了解如何实现快速实现全面的表面分析。
X射线光电子能谱分析表面特性
表面分析可被用于了解以下任一领域：
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基于材料深度或厚度的共同特性和工艺。
50 years of XPSDiscover how XPS has impacted research over the last 50 years.
XPS - John Watts, Professor of Materials Science, University of SurreyProfessor John Watts goes over how to solve materials problems with XPS.
XPS Overview with XPS Facility Manager Robert PalgraveMr. Palgrave of University College London goes over analyzing solid-state and thin film materials using XPS.
The Surface Analysis Toolbox Combining XPS with ISS, REELS, AES, UPS, and Raman in a workflowThis webinar will introduce these additional techniques and show how they can be used with XPS to build comprehensive understanding of the surfaces of materials.
Surface Analysis The Basics & Beyond session (part 1) of the Ignite Surface Analysis Virtual Scientific ConferenceThe speakers Tim Nunney (Thermo Fisher Scientific), Raheleh Azmi (KIT) and Dr Vinod C. Prabhakaran (NCL) give presentations on the basics of XPS.
Multi-technique and Complementary Analysis session (part 2) of the Ignite Surface Analysis Virtual Scientific ConferenceThe speakers Roland Barbosa (Covalent Metrology), Paul Mack and Herman Lemmens (Thermo Fisher Scientific) give presentations on multi-technique and complementary analysis.
Analysis of Materials for Advanced Applications (part 3) of the Ignite Surface Analysis Virtual Scientific ConferenceThe speakers Damien Aureau (UVSQ), Robert Palgrave (UCL) and Albert Ge (Thermo Fisher Scientific) give presentations on analysis of materials for advanced applications.
Applications Q&APanel discussion (part 4) of the Ignite Surface Analysis Virtual Scientific ConferenceThe speakers Tim Nunney, Paul Mack, Robin Simpson, Hsiang-Han Tseng, Stuart Blackburn (Thermo Fisher Scientific) answer applications questions.
Thermo Fisher Scientific Avantage DatasystemThe XPS knowledge view is a powerful reference tool included within Avantage Datasystem
XPS Depth profilingDepth profiling is a common experiment using XPS surface analysis instrumentation. This presentation explains how a depth profile is set up, the types of equipment available to work with different types of sample, and is illustrated with example anal
The Basics of XPS Surface Analysis, Part 1This presentation gives an introduction to X-ray photoelectron spectroscopy, a key technique for understanding materials. The first part of this two part series describes the fundamentals of the technique, the instrumentation, and is illustrated with
The Basics of XPS Surface Analysis, Part 2The second part of this two part presentation shows how X-ray photoelectron spectroscopy can solve a problem by walking through a complete analysis of a sample, with tips on how to successfully collect and process XPS data.
Thermo Scientific Magcis Dual Beam Ion SourceThe Thermo Scientific MAGCIS dual mode ion source enables depth profiling analysis and surface cleaning of both soft and hard materials on the same XPS instrument.
XPS相关网络讲座
利用 Avantage 软件了解 XPS 图谱和深度剖面图 - 第 2 部分
通过观看网络讲座，您将了解如何使用正确的工具来解读多层数据，例如深度剖析和图像。
利用 Avantage 软件了解表面化学
该网络讲座旨在为现有Avantage 软件用户提供培训，同时向对其不熟悉的用户进行科普介绍。
薄膜的表面分析
探索一系列针对薄膜涂层分析的应用，包括法医学研究、石墨烯、多层玻璃、涂层织物和光伏系统。
了解金属表面和氧化物
XPS 可以提供样品表面最表面纳米级的化学态信息，从而分析钝化涂层、了解催化剂化学性质以及开发生物兼容涂层。
多技术联用表面分析和样品团簇清洁
我们展示双模式离子源如何用于多技术联用分析，体现了样品清洁的重要性以及如何进行深度剖析测试。
使用 XPS 表征聚合物
本网络讲座涵盖了 X 射线光电子能谱的基础知识，特别强调了如何将其用于聚合物表面分析领域。X 射线光电子能谱是用于材料表面化学分析的一项重要技术。
- The Surface Analysis Toolbox Combining XPS with ISS, REELS, AES, UPS, and Raman in a workflow
This webinar will introduce these additional techniques and show how they can be used with XPS to build comprehensive understanding of the surfaces of materials.
- Surface Analysis The Basics & Beyond session (part 1) of the Ignite Surface Analysis Virtual Scientific Conference
The speakers Tim Nunney (Thermo Fisher Scientific), Raheleh Azmi (KIT) and Dr Vinod C. Prabhakaran (NCL) give presentations on the basics of XPS.
- Multi-technique and Complementary Analysis session (part 2) of the Ignite Surface Analysis Virtual Scientific Conference
The speakers Roland Barbosa (Covalent Metrology), Paul Mack and Herman Lemmens (Thermo Fisher Scientific) give presentations on multi-technique and complementary analysis.
- Analysis of Materials for Advanced Applications (part 3) of the Ignite Surface Analysis Virtual Scientific Conference
The speakers Damien Aureau (UVSQ), Robert Palgrave (UCL) and Albert Ge (Thermo Fisher Scientific) give presentations on analysis of materials for advanced applications.
- Applications Q&APanel discussion (part 4) of the Ignite Surface Analysis Virtual Scientific Conference
The speakers Tim Nunney, Paul Mack, Robin Simpson, Hsiang-Han Tseng, Stuart Blackburn (Thermo Fisher Scientific) answer applications questions.
- Thermo Fisher Scientific Avantage Datasystem
The XPS knowledge view is a powerful reference tool included within Avantage Datasystem
- XPS Depth profiling
Depth profiling is a common experiment using XPS surface analysis instrumentation. This presentation explains how a depth profile is set up, the types of equipment available to work with different types of sample, and is illustrated with example anal
- The Basics of XPS Surface Analysis, Part 1
This presentation gives an introduction to X-ray photoelectron spectroscopy, a key technique for understanding materials. The first part of this two part series describes the fundamentals of the technique, the instrumentation, and is illustrated with
- The Basics of XPS Surface Analysis, Part 2
The second part of this two part presentation shows how X-ray photoelectron spectroscopy can solve a problem by walking through a complete analysis of a sample, with tips on how to successfully collect and process XPS data.
- Thermo Scientific Magcis Dual Beam Ion Source
The Thermo Scientific MAGCIS dual mode ion source enables depth profiling analysis and surface cleaning of both soft and hard materials on the same XPS instrument.
XPS相关网络讲座
利用 Avantage 软件了解 XPS 图谱和深度剖面图 - 第 2 部分
通过观看网络讲座，您将了解如何使用正确的工具来解读多层数据，例如深度剖析和图像。
利用 Avantage 软件了解表面化学
该网络讲座旨在为现有Avantage 软件用户提供培训，同时向对其不熟悉的用户进行科普介绍。
薄膜的表面分析
探索一系列针对薄膜涂层分析的应用，包括法医学研究、石墨烯、多层玻璃、涂层织物和光伏系统。
了解金属表面和氧化物
XPS 可以提供样品表面最表面纳米级的化学态信息，从而分析钝化涂层、了解催化剂化学性质以及开发生物兼容涂层。
多技术联用表面分析和样品团簇清洁
我们展示双模式离子源如何用于多技术联用分析，体现了样品清洁的重要性以及如何进行深度剖析测试。
使用 XPS 表征聚合物
本网络讲座涵盖了 X 射线光电子能谱的基础知识，特别强调了如何将其用于聚合物表面分析领域。X 射线光电子能谱是用于材料表面化学分析的一项重要技术。
采用电镜进行过程控制
现代工业需求高通量、质量卓越、通过稳健的工艺控制维持平衡。SEM扫描电镜和TEM透射电镜工具结合专用的自动化软件，为过程监控和改进提供了快速、多尺度的信息。
仪器卡片原件样式表
需要更多X射线光电子能谱的相关资料？ 请填写下面的表格，我们会尽快与您联系！
支持和服务页脚样式表
字体样式表
卡片样式表
